Recent Research Projects

Novel scanning, milling and data handling strategies for circuit analysis

2019/20 • $27,645
Computer chip manufacturing companies use high resolution electron microscopes to scan a chip and high-powered ion beams to remove material (dig under the surface), expose buried features, and thereby determine whether other companies are copying their chips and infringing upon their...

Novel scanning, milling and data handling strategies for circuit analysis********

2018/19 • $67,525
Computer chip manufacturing companies use high resolution electron microscopes to scan a chip and high-powered ion beams to remove material (dig under the surface), expose buried features, and thereby determine whether other companies are copying their chips and infringing upon their...

Focused Ion Beam de-Layering and Device Modification of Electronic and Photonic Circuits**

2018/19 • $25,000
In this project, we seek to employ new patterning instrumentation in the form of plasma (xenon) ion Focused*Ion Beam (FIB) milling to control the size, shape and degree of packaging of semiconductor and photonic*devices. Novel plasma ion beams are new instruments that have an advantage in that...

Further Development and Evaluation of an Automated Image Analysis Pipeline for Semiconductor Circuit Reverse Engineering

2017/18 • $12,500
The objective of this proposal is to develop a software tool consisting of a suite of image analysis techniques tohelp automate the detection of patents infringement related to circuitry in integrated circuits (ICs). Ourproposed software will aid in automating the process of circuit extraction,...

Development of automated image analysis pipeline for semiconductor circuit reverse engineering

2016/17 • $25,000
The objective of this proposal is to develop a software tool consisting of image analysis techniques to help automate the detection of infringement of patents related to circuitry in integrated circuits (ICs). Our proposed software will aid in automating the process of circuit extraction, where...

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